GSA Annual Meeting Exhibitor
Booth: 223
IXRF Systems, Inc.
Automated EDS systems includes: Quantitative Analysis, High Resolution Digital Imaging, X-ray Mapping, Linescans, and Particle Analysis. FREE software upgrades for LIFE, compatibility with any EDS detector on any SEM/TEM.
Exclusive Micro XRF additions to the SEM: PPM level trace analysis (true analytical SEM) provides traditional XRF analysis inside the SEM.
Web Page: www.ixrfsystems.com
Contact: IXRF Systems, Inc
15715 Brookford Drive
Houston , TX 77058
USA
Email: info@ixrfsystems.com
Phone: 281-286-6485
Fax: 281-286-2660

Category: Geological and Geophysical Instrumentation

Exhibit Hours:
Sunday, 5 Oct. 7:00 p.m. - 9:00 p.m.
Monday, 6 Oct. 9:00 a.m. - 6:00 p.m.
Tuesday, 7 Oct. 9:00 a.m. - 6:00 p.m.
Wednesday, 8 Oct. 9:00 a.m. - 2:00 p.m

2007 GSA Denver Annual Meeting (28–31 October 2007)

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