NEW CRYSTALLIZATION THERMOMETERS FOR ZIRCON, RUTILE AND SPHENE: CALIBRATIONS, DIFFUSION CONSIDERATIONS, AND APPLICATIONS
log(Tizcn) = 6.03 - 5080/T
log (Zrrut) = 7.36 - 4470/T
log(Zrsph) = 11.30 - 9615/T
(T is in Kelvins; Ti and Zr refer to the concentrations of these elements in ppmw; all calibrations are for a nominal pressure of 1 GPa). The Ti-in-zircon thermometer is insensitive to pressure; Zr in rutile shows minor sensitivity to pressure, and Zr in sphene decreases by a factor of ~6 in response to a pressure increase of 1 GPa. These thermometers can be implemented using available in situ analytical techniques (EMPA; LA-ICP/MS; SIMS); in general, however, LA-ICP/MS or SIMS is needed for zircons crystallized below ~ 850°C and sphenes below ~725°C. The EMPA can be used for Zr-in-rutile thermometry on crystals formed at temperatures as low as ~500°C. Preliminary diffusion data for Ti in zircon indicate a high closure temperature broadly consistent with existing diffusion data for other tetravalent ions. However, Zr in rutile is relatively fast-diffusing, raising the possibility of partial diffusive re-equilibration to temperatures below 600°C in some retrograde environments. Diffusion of Zr in sphene is intermediate between the other two, implying generally closed-system behavior. Applications and intercomparisons of the new thermometers will be made with reference to natural rocks ranging from glassy rhyolites to subduction-zone migmatites.