EFFECT OF SURFACE ROUGHNESS ON THE THERMAL INFRARED SPECTRAL CHARACTERISTICS OF MARS-RELEVANT SILICA-RICH MATERIALS
To quantify how surface roughness affects thermal infrared spectral characteristics, we roughened with known grit sizes different types of sample materials (i.e., fused quartz, glass, and silicon wafers) and measured surface roughness with the use of a stylus profilometer and a scanning electron microscope. This approach allowed us to assess how different degrees of roughening in materials with different types of structural ordering could affect the infrared spectra of silica-rich materials roughened in a reproducible manner. Stylus profilometry data were quantified using a scale-dependent root-mean-square roughness parameter. Scales of observation ranged from 10 μm to 1 cm. Fractal dimensions were also estimated to characterize surface roughness. We found that changes in spectral contrast could be linked with the magnitude and type of surface roughness, and that these factors may confound estimations of relative amounts of silica phases in natural samples. Our findings demonstrate the utility of a protocol that results in reproducibly roughened sample surfaces for spectral analysis. Such a protocol will be particularly helpful as spectral datasets continue to grow with the inclusion of data from powdered, sawn, and weathered surfaces of geological samples.