METHODOLOGY FOR DETAILED TRACE ELEMENT MAPPING OF GARNET BY LASER ABLATION ICP-MS: A LOOK AT UNRAVELING ZONING AND INCLUSIONS
Using detailed LA-ICP-MS spot mapping of garnet cross sections, full elemental maps can be generated at resolutions of <100 microns for concentrations as low as 1-10 parts-per-billion. Trace element mapping as opposed to limited spot or line analyses provides significantly more information and the ability to produce false color maps of elemental information. A comparison of multiple discrete spots vs. line scanning mapping is presented. While spot mapping is slower (sometimes >20 hours per map) than line scan mapping, spot mapping allows the recovery of useful information even in the presence of inclusions. For line scan mapping, if a high REE inclusion were encountered along the line the signal washout would blur over a considerable distance rendering that portion of the grain unrecoverable in terms of true REE concentration in the garnet. Whereas with spot mapping and detailed data mining for each analyses, useful garnet may still be recoverable from that spot. With subsequent TIMS analyses of the garnet, detailed comparisons between the LA-ICP-MS and TIMS data are obtained. Calibration, automation and data processing methods will be presented in this comprehensive overview of the use of LA-ICP-MS for garnet analyses.