DISTRIBUTION OF [SI-V]- DEFECT IN NATURAL TYPE IIA DIAMONDS
Seven natural type IIa gem diamonds were analyzed in this study. A common feature of this group of diamonds is occurrence of euhedral olivine inclusions, which is very rare among natural type IIa diamonds and good evidence that these IIa diamonds were formed in the lithospheric mantle. Occurrence of [Si-V]- in these stones were detected among enormous natural type IIa diamonds routinely analyzed in GIA laboratories. Distribution of [Si-V]-, Nii+ and many other emissions were mapped over the table faces using various laser excitations at liquid nitrogen temperature. It was found that intensities of [Si-V]- emission varied significantly over a small area. The distribution patterns were irregular and changed from stone to stone. Distribution of Nii+ emissions showed irregular patterns, but entirely different from that of [Si-V]-. There is no correlation in spatial distribution of these two defects in natural type IIa diamonds, in drastic contract to that observed in HPHT synthetics. Possible causes of the contrast behaviors of [Si-V]- distributions in natural and HPHT synthetic diamonds, and their implications in diamond formation and gem diamond identification will be discussed.