RESOLVING LARGE MAGNITUDE AND WIDESPREAD ANNEALING OF LUNAR ZIRCON THROUGH CORRELATIVE SIMS, EBSD AND RAMAN SPECTROSCOPY
We have applied a combination of secondary ion mass spectrometry (SIMS), electron backscatter diffraction (EBSD), and Raman spectroscopy to a suite of lunar zircon grains from four Apollo landing sites and possessing a variety of lithologic contexts: zircon grains within a quartz monzodiorite rock fragments, isolated grains within lunar breccias, and loose grains in the lunar regolith. Raman spectroscopy identifies the local damage state as the primary control on both band broadening and band position, and documents significant annealing. The fractional dose, calculated as the ratio of effective dose and total dose, varies from 0.22 to 0.77. These are the lowest fractional doses reported for lunar zircon, and require that some thermal processes driving annealing are young. Notably, present-day damage states do not correlate with known episodes of thermal/mechanical disturbance. These observations have several implications for the study of lunar zircon including: (1) high-T processes may anneal a large percentage of lunar zircon grains, (2) damage states may reflect periods of incomplete annealing, complicating any broad application of Raman-based “radiation damage ages” to study the thermal histories of lunar zircon, and (3) in the absence of shock deformation, the balance (or lack thereof) between radiation damage and annealing will exert the main control on trace element and isotope mobility.