Abstract Details

CHARACTERIZING SECONDARY X-RAY AMORPHOUS MATERIALS ON MARS VIA MISSION DATA AND ANALOG STUDIES

RAMPE, Elizabeth1, BISHOP, Janice2, HORGAN, Briony3, SMITH, Rebecca J.4, ACHILLES, Cherie N.5 and THORPE, Michael T.1, (1)NASA Johnson Space Center, 2101 NASA Pkwy, Houston, TX 77058, (2)Hawaii Institute of Geophysics and Planetology, University of Hawaii at Manoa, 1680 East West Road, POST 508B, Honolulu, HI 96822, (3)550 Stadium Mall Dr.Earth, Atmospheric, and Planetary Sci, 516 High St, Bellingham, WA 98225, (4)Department of Geosciences, Stony Brook University, Stony Brook, NY 11790, (5)NASA GSFC, USRA, Greenbelt, MD 20771