North-Central Section (44th Annual) and South-Central Section (44th Annual) Joint Meeting (11–13 April 2010)

Paper No. 11
Presentation Time: 8:30 AM-12:00 PM

TAKE YOUR XRF LAB TO THE FIELD


SEYFARTH, Alexander, BRUKER AXS Inc, 5465 E Cheryl Pkwy, Madison, WI 53711, Alexander.Seyfarth@bruker-axs.com

Field Applications for Hand Held XRF and Comparison with Traditional XRF Spectrometers.

Traditional XRF (WD XRF) is a well established method for elemental analysis capable of measuring major, minor and trace concentrations in the geochemical samples. XRF is capable of direct sample measurements, without having to dissolve, atomize and destroy the sample, as with ICP analysis. Nevertheless sample preparation is required, which can involve grinding the sample and fusion of the sample with a glass former to achieve highest accuracy (for majors). In this case, the non destructive technique is “destructive” although the specimen remains intact as prepared after the analysis and can be reused.

How about using powders or fine grained samples directly; or better still, analyzing rock samples directly? The fundamental concepts of physics governing XRF and specimen preparation will be examined as they apply to the analysis sediments, soils, and rocks using hand held XRF.

With these concepts in mind, the limitations of the Point’N’Shoot instrumentation and “Fundamental Parameter” methods will be discussed. By applying lab based XRF calibration concepts to hand held XRF it is possible to achieve comparable results, without sample preparation. Now the hand held XRF can be utilized in the field directly with samples of limestone, shale and sediments, but also works on basalts! Now, armed with the right tool, it is easy to investigate “harmful” elements onsite.